Press release
G-Hexa Launches Specialized Inventory for High-Precision AFM Probes, AFM Cantilevers, and AFM Tips
BENGALURU, India - 18/12/2025 - G-Hexa, a premier material characterization vendor, today announced a "Probe-First" analytical protocol to eliminate image artifacts. By prioritizing the precise selection of AFM Probes, AFM Cantilevers, and AFM Tips based on material physics, G-Hexa ensures researchers receive data reflecting true material properties, not tip-induced errors."Accuracy is defined by the physics of the cantilever," said Mahesh Reddy, CMO at G-Hexa. "Our inventory ensures the spring constant of our AFM Cantilevers is mathematically matched to the client's material."
Standard labs often use "general purpose" probes for everything from ceramics to biology, causing poor resolution. G-Hexa reverses this by curating project-specific consumables for every analysis.
Optimized Solutions & Instrumentation G-Hexa offers immediate access to specialized sensing elements executed on Asylum Research Jupiter XR and Bruker Dimension Icon platforms:
Life Sciences: Ultra-soft Silicon Nitride AFM Cantilevers for live cells.
Energy Storage: Conductive AFM Probes (PtIr coated) for battery SEI layers.
Semiconductors: High-frequency tips for wafer roughness analysis.
Mahesh Reddy
info@g-hexa.com
+91 72593 61109
https://g-hexa.com/characterization/
G-Hexa bridges the gap between academic precision and industrial speed. We combine high-end testing on CAMECA and Zeiss platforms with a specialized inventory of AFM Probes and Tips, ensuring zero-artifact data for the biotech, energy, and semiconductor sectors.
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