G-Hexa Deploys Atom Probe Tomography to Solve Critical Semiconductor Failure Analysis Challenges in India

BENGALURU, India - 18/12/2025 - As India's semiconductor ecosystem expands, the demand for identifying microscopic defects in wafer fabrication has reached critical levels.

G-Hexa Research Center today announced a specialized technical initiative to support chip manufacturers and researchers with high-precision Failure Analysis using Atom Probe Tomography (APT).

While standard microscopy (like SEM/TEM) can visualize structural defects, it often fails to detect the chemical impurities that cause modern chips to fail. G-Hexa is addressing this gap by providing access to Atom Probe Tomography, a technique capable of 3D atomic-scale reconstruction. This allows engineers to pinpoint specific dopant fluctuations and grain boundary segregation that lead to device failure.

"Standard imaging is no longer enough for sub-10nm nodes," said Mahesh Reddy , CMO at G-Hexa Research Center. "By applying Atom Probe Tomography to Semiconductor Failure Analysis, we are giving Indian engineers the ability to see individual atoms. This is the difference between guessing why a chip failed and knowing the exact root cause."

Solving Real-World Industry Problems:

G-Hexa's new service line is specifically calibrated for:

Wafer Defect Analysis: Identifying metallic contamination at the parts-per-billion level.

Gate Oxide Breakdown: Using APT to analyze interface roughness and chemical mixing in transistors.

3D NAND Flash Inspection: Mapping complex vertical structures that traditional tools cannot penetrate.

G-Hexa is currently accepting complex failure analysis cases from semiconductor startups, FABs, and academic researchers. The center offers a "Remote Lab" model, allowing clients from Delhi, Hyderabad, and Pune to ship samples and receive digital atomic-level reports within days.
"We don't just provide data; we provide the answer to 'Why did this fail?'," added Mahesh Reddy.

To submit a sample for Atom Probe Tomography or discuss a failure investigation, visit: https://g-hexa.com/characterization/

About G-Hexa Research Center

G-Hexa Research Center is India's emerging leader in advanced Material Characterization. We specialize in solving complex industrial problems using FESEM, TEM, and Atom Probe Tomography (APT). We serve as a strategic technical partner for the Aerospace, Semiconductor, and Nanotechnology sectors.

Mahesh Reddy
info@g-hexa.com
+91 72593 61109
https://g-hexa.com/characterization/

G-Hexa Research Center introduces advanced Failure Analysis solutions for the Indian semiconductor sector, utilizing Atom Probe Tomography (APT) to detect atomic-level defects and impurities in wafers and chips.

This release was published on openPR.