Ghexa Research Centre Announces Integrated "FIB-to-CAMECA" Workflow, Streamlining High-Yield CAMECA Atom Probe Tomography for Advanced Materials R&D

BENGALURU, INDIA - December 23, 2025 - Ghexa Research Centre Pvt Ltd, a premier provider of advanced material characterization services, today announced the launch of its integrated "FIB-to-CAMECA" workflow. This specialized service line is designed to address the industry-wide challenge of sample preparation failure, significantly improving data yield and turnaround times for clients utilizing CAMECA Atom Probe Tomography.

As semiconductor nodes shrink below 3nm and superalloys become increasingly complex, R&D teams heavily rely on CAMECA Atom Probe Tomography to visualize materials at the atomic scale. However, the success of this sophisticated analysis depends entirely on the quality of the sample preparation. Standard laboratory protocols often result in low success rates due to micro-fractures or contamination during the "lift-out" process, leading to wasted budget and lost critical data.

Ghexa Research Centre's new workflow bridges this gap by tightly integrating site-specific sample preparation on the Thermo Fisher Helios 5 DualBeam FIB with the analysis capabilities of high-end CAMECA instruments.

"The industry has long treated sample preparation and final analysis as two separate steps, often performed by different vendors. This disconnect is the primary cause of data failure," said Mahesh Reddy, CMO of Ghexa Research Centre Pvt Ltd. "By launching our integrated 'FIB-to-CAMECA' workflow, we are offering a seamless chain of custody. We engineer the sample specifically for the physics of the CAMECA Atom Probe Tomography system, ensuring that our clients get definitive, artifact-free 3D data the first time."

Key benefits of the integrated workflow include:

Higher Success Rates: Site-specific FIB lift-out techniques reduce the risk of tip fracture during the high-voltage pulsing required by CAMECA Atom Probe Tomography.

Artifact Reduction: The workflow minimizes oxidation and contamination between the preparation and analysis stages, crucial for semiconductor and battery research.

Precision Targeting: The ability to target specific grain boundaries or transistor gates with nanometer precision, ensuring the relevant volume is captured in the final atom map.

This enhanced capability positions Ghexa Research Centre as a critical partner for high-tech sectors, including Semiconductor Manufacturing, Aerospace Metallurgy, and Energy Storage, where CAMECA Atom Probe Tomography is essential for validating next-generation materials.

For more information about Ghexa Research Centre's characterization services, please visit https://g-hexa.com/characterization/.

Dr Carmel Mary Esther
Ghexa Research Centre Pvt Ltd
info@g-hexa.com
Phone: +91 72593 61109
https://g-hexa.com

About Ghexa Research Centre Pvt Ltd Ghexa Research Centre is a leading material characterization facility based in BENGALURU, India. Bridging the gap between academic precision and industrial speed, the company provides comprehensive analytical services including integrated workflows for CAMECA Atom Probe Tomography, FIB-SEM, and advanced microscopy. Ghexa Research Centre supports global R&D teams in solving complex failure analysis and process development challenges.

This release was published on openPR.