Press release
Global Semiconductor Inspection Systems Market SWOT Analysis by Key Players: KLA-Tencor, Applied Materials, Herms Microvision, Lasertech, ASML Holding, Lam Research, JEOL, FEI, Carl Zeiss, Nikon, Hitachi High-Technologies, Nanometrics Incorporated, Planar
This report presents the worldwide Semiconductor Inspection Systems market size (value, production and consumption), splits the breakdown (data status 2013-2018 and forecast to 2025), by manufacturers, region, type and application.This study also analyzes the market status, market share, growth rate, future trends, market drivers, opportunities and challenges, risks and entry barriers, sales channels, distributors and Porter's Five Forces Analysis.
Semiconductor Inspection System is the equipment used in manufacturing process of semiconductor device to detect the failure.
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Wafer inspection systems will continue its dominance in the market during the estimated period and is likely to occupy more than 80% of the overall market share. Much of the segment’s growth comes from the rising demand for semiconductor ICs, coupled with increased production capacity of ICs. Semiconductor IC manufacturers are constructing new fabs and are also increasing the production capacity of their existing fabs. Such developments will increase the capital expenditure on equipment and subsequently, on inspection systems during the forecast period.
The foundries segment occupies the largest share in the market and will continue to dominate the market during the forecast period. The growing demand for electronic devices such as digital cameras, gaming consoles, notebooks, tablets, smartphones, network switches, and set-top boxes have propelled the requirement for adequate foundries.
The Semiconductor Inspection Systems market was valued at xx Million US$ in 2017 and is projected to reach xx Million US$ by 2025, at a CAGR of xx% during the forecast period. In this study, 2017 has been considered as the base year and 2018 to 2025 as the forecast period to estimate the market size for Semiconductor Inspection Systems.
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The following manufacturers are covered in this report:
KLA-Tencor
Applied Materials
Herms Microvision
Lasertech
ASML Holding
Lam Research
JEOL
FEI
Carl Zeiss
Nikon
Hitachi High-Technologies
Nanometrics Incorporated
Planar Corporation
Rudolph Technologies
Toray Engineering
Tokyo Seimitsu
Semiconductor Inspection Systems Breakdown Data by Type
By Inspection Type
Wafer Inspection System
Mask Inspection System
By Technology
Optical Inspection System
E-Beam Inspection System
Semiconductor Inspection Systems Breakdown Data by Application
Foundries
Memory Manufacturers
Integrated Device Manufacturer (IDMs)
Semiconductor Inspection Systems Production by Region
United States
Europe
China
Japan
Other Regions
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