Press Releases from ASSET InterTech (7 total)
Strategic relationship with SiliconAid extends ASSET’s ScanWorks platform into …
Strategic relationship with SiliconAid extends ASSET’s ScanWorks platform into chip test and verification
Chip debugger will be integrated into ScanWorks®; ASSET to resell IEEE P1687 insertion and verification tools
Richardson, TX (November 3, 2009) – ASSET® InterTech (www.asset-intertech.com), the leading supplier of open tools for embedded instrumentation, and SiliconAid Solutions (www.siliconaid.com), Austin, TX., have formed a strategic relationship whereby ASSET will integrate its first integrated circuit (IC) test tool into the ScanWorks®…
Cray selects ASSET’s ScanWorks platform for embedded diagnostics in next-gener …
Richardson, TX / Munich (August 19, 2009) – Supercomputer leader Cray Inc. has selected ASSET® InterTech’s ScanWorks® platform for embedded instrumentation as the basis for embedded test solutions critical to Cray’s next-generation supercomputers. ASSET (asset-intertech.com) is the leading supplier of open tools for embedded instrumentation for design validation, test and debug. Cray will collaborate with ASSET and ASSET will deliver embedded test logic intellectual property (IP) that will support high-reliability…
Dehne, longtime National Instruments executive, joins ASSET’s Board of Directo …
Richardson, TX / Munich (June 17, 2009) – Tim Dehne, until recently a longtime executive with National Instruments, Inc. (NI), has joined the board of directors of ASSET® InterTech, Inc. (asset-intertech.com), the leading supplier of open tools for embedded instrumentation. Over a career stretching more than 21 years at NI, Mr. Dehne led global marketing, and research and development at the company that had $824 million in revenues in 2008.…
ASSET’s ScanWorks for Embedded Boundary Scan offers in-system JTAG test and di …
Embedding ScanWorks in high-availability systems optimizes remote test application and programming
Richardson, TX / Munich (February 3, 2009) – The new ScanWorks® for Embedded Boundary Scan from ASSET® InterTech (asset-intertech.com), the leading supplier of open tools for embedded instrumentation, can be easily embedded in high-availability systems where it can apply system-level JTAG (SJTAG) test, diagnostic and programming algorithms. Typically, the ScanWorks for Embedded Boundary Scan intellectual property (IP) will be embedded…
ASSET assumes a leadership position as ASSET assumes a leadership position as sc …
Richardson/Munich, September 01, 2008 –ASSET® InterTech Inc. (asset-intertech.com), the leading supplier of open tools for embedded instrumentation, recently became a founding member of the International Electronics Manufacturing Initiative’s (iNEMI) boundary scan adoption project. iNEMI, which is an electronics industry consortium of over 70 manufacturers, suppliers and related organizations, has undertaken an effort to encourage greater adoption of the IEEE 1149.1 boundary scan standard (commonly known as JTAG, after the…
Maxim seeks ASSET ScanWorks’ embedded instrumentation support
Maxim joins growing list of instrumentation solutions providers who are choosing ScanWorks’ open tools
Richardson, TX (August 12, 2008) –ASSET® InterTech (asset-intertech.com), the leading supplier of open tools for embedded instrumentation, has announced that its ScanWorks® platform supports unique margining and forensics capabilities through several of Maxim Integrated Products’ (www.maxim-ic.com) system monitor and system manager devices.
ScanWorks can be used with Maxim’s MAX16031/MAX16032 system monitors and MAX16046-MAX16049 system managers through the…
ASSET® InterTech Acquires International Test Technologies
Acquisition will merge structural JTAG test and functional processor emulation testing
Richardson, TX / Gräfelfing (December 4, 2007) – ASSET InterTech Inc., (asset-intertech.com) has acquired International Test Technologies (ITT -- intertesttech.com) of County Donegal, Ireland, a supplier of processor emulation technology used by electronics manufacturers. ASSET provides boundary-scan (aka IEEE 1149.1 or JTAG) systems for test, in-system programming (ISP) and design-for-test (DFT), as well as for advanced embedded instrumentation applications involving…
