Press Releases from Sunrise Optical LLC (5 total)

Sunrise, Florida, June 22, 2011 Sunrise Optical LLC: LED heat sink metrology tool is now being offered also for high power electronics application. Tool allows measurement of the geometry of the heatsink, and paste.    Please contact our sales department (sales@zebraoptical.com) for a more detailed application notes, and schedule tool demonstration. Product Availability: Sample measurement service is available now (please contact aplab@zebraoptical.com for details). Lead-time for the tool in the basic configuration is…

Sunrise, Florida, May 16, 2011 Sunrise Optical LLC: New Zebraoptical Low Coherence Fiber Optic Interferometer with Microscope Attachment has been developed for Micro Electromechanical Systems (MEMS) applications and is available for sale as Zebraoptical Integrated Metrology Tool (ZIMT). The Zebraoptical Integrated Metrology Tool employs standard Zebra Wafer Thickness and Wafer Topography Metrology (ZebraOptical CT-IR) coupled with optical microscope and VIS/NIR spectrometer. Zebraoptical Integrated Metrology Tool (ZIMT) allows user to measure substrate thickness, membrane…

Sunrise, Florida, May 4, 2011 Sunrise Optical LLC: Liquid samples including drops and splatters can easily be measured using our new Portable Model P-1PORT Zebra Optoprofiler. Drops and splatters can be measured on vertical, inclined or horizontal surfaces. Please contact our sales department (sales@zebraoptical.com) for more detailed application notes, and schedule tool demonstration. The Portable Zebra Optoprofiler P-1PORT is capable of measuring topography of small and medium size objects. The data collected…

The Portable Zebraoptical OptoProfiler for topography of small and medium size objects . SOLLC: Zebra OptoProfiler Portable Metrology Tool for full surface metrology for small and medium size objects. Sunrise, Florida, January 4, 2011 Sunrise Optical LLC has added a new Portable Model P-1-PORT to Zebra OptoProfiler product family for small and medium size objects. First unit is scheduled for shipment January 2011. The Portable Zebra OptoProfiler P-1-PORT is capable of measuring topography of small and medium…

Zebra Optoprofiler for QE uniformity metrology for crystalline and thin film solar cells is available. Sunrise Optical LLC is accepting prequalified samples for the tool evaluation. Sunrise Optical LLC: Zebra Optoprofiler QE Uniformity Tool for metrology of QE uniformity has been released and is undergoing evaluation on crystalline and thin film solar cells, mini-modules and modules. Sunrise, Florida, March 12, 2010 - Sunrise Optical LLC has added Quantum Efficiency (QE) Uniformity tool…