Press Releases from Skryray XRF (1 total)
Skyray XRF will Introduce Instruments at MJSA Jewelry Expo
Skyray XRF will introduce two x-ray fluorescence (XRF) instruments designed for the needs of the jewelry industry at the 2008 MJSA Expo (New York City, April 13-15). The instruments that Skyray XRF will introduce at booth 221 are the EDX-2800 and EDX-3000. Both units are low-cost alternatives for performing non-destructive karat analysis, plating thickness measurements, alloy testing and bulk analysis.
The EDX-2800 will also provide users with…
