07-17-2012 08:01 PM CET - Science & Education
Print PDF Email

Coating Thickness and More with Newest XRF Analyzer

Press release from: Eastern Applied Research Inc.
Element Xr Xray Fluorescence for Coating Thickness
Element Xr Xray Fluorescence for Coating Thickness
Buffalo, NY – With the Element Xr line of x-ray fluorescence (XRF) analyzers establishing itself as a top value for coating thickness measurement needs, Eastern Applied Research has developed the newest XRF from the line to go beyond just thickness. The Element Xr M6 provides users the ability to accurately measure a range of coating thicknesses but also to obtain qualitative and quantitative analysis of materials.

Available with three options of detector systems, the EXr M6 can be customized to provide the best price-to-performance ratio for a specific testing need. The traditional version of the system features a proportional counter detection system and is optimum for standard coating thickness measurements (single layer, etc). This configuration provides the lowest cost of acquisition. If a user is considering x-ray fluorescence for more involved thickness needs (thin film, multi-layer) or has a quantitative analysis interest then newer detector technologies, Si-PIN and Silicon Drift (SDD), would be offered. While still offering excellent value based on the overall analyzer design, these detectors provide increased sensitivity, greater resolution and faster measurement times.

Designed for expanding the Element Xr line beyond coating thickness applications, the overall chamber design was also developed with versatility of application in mind. A top-down measurement system, the chamber has an accommodating door that swings open (up/down) to expose both the front and sides of the interior chamber. Many large parts will easily fit in the chamber that includes a moveable stage platform. A last advancement of the line featured in this latest model is the new software package which provides an overall streamlined navigation and report functionality through its Windows7 OS operation.

For over twenty years, Eastern Applied Research has provided x-ray fluorescence solutions for coating thickness measurement and material analysis needs. The new Element Xr analyzer line offers versatility and precision for basic to complex coating applications. Information on the full range of XRF analyzers available can be found at www.EasternApplied.com.

Eastern Applied Research Inc.
6614 Lincoln Ave - Lockport, NY 14094
Shawn Kramer
716-201-1115
xrfservice@easternapplied.com

This release was published on openPR.
News-ID: 228190
del.icio.us:Coating Thickness and More with Newest XRF Analyzer - Pressreleases - openPR - Science & Education MisterWong:Coating Thickness and More with Newest XRF Analyzer - Pressreleases - openPR - Science & Education Digg:Coating Thickness and More with Newest XRF Analyzer - Pressreleases - openPR - Science & Education StumbleUpon:Coating Thickness and More with Newest XRF Analyzer - Pressreleases - openPR - Science & Education Technorati:Coating Thickness and More with Newest XRF Analyzer - Pressreleases - openPR - Science & Education Reddit:Coating Thickness and More with Newest XRF Analyzer - Pressreleases - openPR - Science & Education Furl:Coating Thickness and More with Newest XRF Analyzer - Pressreleases - openPR - Science & Education WebNews:Coating Thickness and More with Newest XRF Analyzer - Pressreleases - openPR - Science & Education OneView:Coating Thickness and More with Newest XRF Analyzer - Pressreleases - openPR - Science & Education LinkArena:Coating Thickness and More with Newest XRF Analyzer - Pressreleases - openPR - Science & Education YiGG:Coating Thickness and More with Newest XRF Analyzer - Pressreleases - openPR - Science & Education
More releases More releases
Permanent link to this press release:

Please set a link in the press area of your homepage to this press release on openPR.
openPR disclaims liability for any content contained in this release.