(openPR) - Sunrise, Florida, May 16, 2011

Sunrise Optical LLC: New Zebraoptical Low Coherence Fiber Optic Interferometer with Microscope Attachment has been developed for Micro Electromechanical Systems (MEMS) applications and is available for sale as Zebraoptical Integrated Metrology Tool (ZIMT).

The Zebraoptical Integrated Metrology Tool employs standard Zebra Wafer Thickness and Wafer Topography Metrology (ZebraOptical CT-IR) coupled with optical microscope and VIS/NIR spectrometer.

Zebraoptical Integrated Metrology Tool (ZIMT) allows user to measure substrate thickness, membrane thickness, coating thickness and investigate optical properties of the coatings all on the same tool platform.

Please contact our sales department (sales@zebraoptical.com) for more detailed application notes and schedule tool demonstration.

Product Availability:
Sample measurement service is available now (please contact aplab@zebraoptical.com for details). Lead-time for the tool in the basic configuration is currently 1 to 3 weeks ARO.

About Sunrise Optical LLC

Sunrise Optical LLC is an optical metrology company located in Sunrise FL. It
specializes in design and manufacturing of spectroscopic and imaging systems for
three-dimensional image acquisition and development of new algorithms for
three-dimensional image processing. Sunrise Optical LLC is serving the
solar cell manufacturing and thin film metrology markets. More information on
Sunrise Optical LLC can be found on the company website
www.zebraoptical.com.

Fanny Szondy
Sunrise Optical LLC
4851 NW 103rd Ave Suite 46
Sunrise FL 33351