(openPR) - Zebra Optoprofiler for QE uniformity metrology for crystalline and thin film solar cells is available. Sunrise Optical LLC is accepting prequalified samples for the tool evaluation.
Sunrise Optical LLC: Zebra Optoprofiler QE Uniformity Tool for metrology of QE uniformity has been released and is undergoing evaluation on crystalline and thin film solar cells, mini-modules and modules.
Sunrise, Florida, March 12, 2010 - Sunrise Optical LLC has added Quantum Efficiency (QE) Uniformity tool to Zebra Optoprofiler product family. Sunrise Optical LLC is accepting prequalified customer samples for tool evaluation.
Zebra Optoprofiler Glass Metrology Tool is capable of measuring uniformity of QE on mini-modules, modules, crystalline silicon and compound cells. Tool is capable of detecting shunts in the thin film samples and spectrally resolved QE uniformity in crystalline samples.
Same technology in scaled down version is offered for glass MEMs substrates on standard hardware Zebra Optoprofiler P-1 and P-2E platforms.
Product Availability
Sample measurement service is now available. Lead-time for tool in the basic configuration is currently 4 to 8 weeks ARO.
About Sunrise Optical LLC
Sunrise Optical LLC is an optical metrology company located in Sunrise FL. It specializes in design and manufacturing of spectroscopic and imaging systems for
three-dimensional (3D) image acquisition and development of new algorithms for
three-dimensional (3D) image processing. Sunrise Optical LLC is serving the solar cell manufacturing and thin film metrology markets. More information on Sunrise Optical LLC can be found on company website www.zebraoptical.com.
Please set a link in the press area of your homepage to this press release on openPR. openPR disclaims liability for any content contained in this release.
Newsfeed
